With or without boundary-scan models
Boundary-scan device models (BSDLs) are pivotal to any JTAG/boundary-scan process as they indicate precisely which pins can be controlled or observed by JTAG/boundary-scan. However, JTAG Maps for Altium can work with or without BSDL models and includes an 'assume scan covered' option.
This feature can also be used to indicate fault coverage to a connector (set to assume scan covered) or to highlight the differences in fault coverage between two equivalent parts. JTAG Maps for Altium will also automatically trace the TAPs (Test Access Ports) from schematic data. The JTAG control nets associated with the TAPs will be highlighted separately from the 'testable' nets.
Import and export
While most users only need the coverage report that JTAG Maps for Altium provides, it is possible to import a more accurate picture. After exporting a JTAG ProVision project, the data can be sent for further analysis. A simple text-based message file containing full fault-coverage information can then be read back into JTAG Maps for highlighting.
Optional Developer Tools
For engineers wishing to apply Boundary-scan tests directly onto their design JTAG Technologies can offer two further options, JTAG Live for low-cost functional testing with boundary-scan and JTAG ProVision a full-blown automated test program generation and device programming system.
Visit jtag.com for guides and details