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JTAG Maps for Altium

 

JTAG Maps is an extension to Altium Designer  which allow users to quickly assess the capabilities of the JTAG devices inside their design. Up to now, engineers should spend hours highlighting the boundary-scan nets of a design manually to determine fault coverage.

Today the free JTAG Maps for Altium application does all this and more, freeing-up valuable time, allowing a more thorough DfT and speeding time to market.

 

With or without boundary-scan models

Boundary-scan device models (BSDLs) are pivotal to any JTAG/boundary-scan process as they indicate precisely which pins can be controlled or observed by JTAG/boundary-scan. However, JTAG Maps for Altium can work with or without BSDL models and includes an 'assume scan covered' option.

This feature can also be used to indicate fault coverage to a connector (set to assume scan covered) or to highlight the differences in fault coverage between two equivalent parts. JTAG Maps for Altium will also automatically trace the TAPs (Test Access Ports) from schematic data. The JTAG control nets associated with the TAPs will be highlighted separately from the 'testable' nets.

Import and export

While most users only need the coverage report that JTAG Maps for Altium provides, it is possible to import a more accurate picture. After exporting a JTAG ProVision project, the data can be sent for further analysis. A simple text-based message file containing full fault-coverage information can then be read back into JTAG Maps for highlighting.

Optional Developer Tools

For engineers wishing to apply Boundary-scan tests directly onto their design JTAG Technologies can offer two further options, JTAG Live for low-cost functional testing with boundary-scan and JTAG ProVision a full-blown automated test program generation and device programming system.

Visit jtag.com for guides and details